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W\1'<,~~Wt, I;ntl.JI}.yl~'!Im',:r.:!~f
...'t~wC"ltIir..,
l,:':C';'JI;k. "-&e"'$:;,t"lI~twe:::<ero
,:ur-,tE>n~'l\j}: ll'I1t1e form>JIa~c.t tlJlTOU!ltleti tJ{'''~lll'ld ~•• ltyol.l1lJll
mm;
mwo}, CURVftros1: be teplar-I!(t iIo'l!l ~e,r;:U!V!)"!'lam$'
~.'-J
:'Ittro
t~tobrv~
synopsys' Predictable Success
65
4/2/2009
Mathematical Formulas (2/2) vecmax (curve) >- Maximum y-value. • • •
vecmax
vecmin (curve) >- Minimum y-value. vecvalx (curve, scalar) >- x-value at a given y vecvaly (curve, scalar) >- y-value at a given x veczero (curve) ____-+~~ve~c~z~e~r~o----~x >- x-value at y = o. diff (curve) >- Retums the first derivative of the curve. vecmin integr (curve)
>- Retums the integral of the curve. tangent (curve) >- Retums the tangent
synopsys' Predictable Success
Macros (1/3) • Macros are predefined commands that can be later recalled. For example, in Inspect, there is a predefined macro, VT, which performs the threshold voltage extraction.
Macros ~u.acortl.;uIn..:.sjrtl.alln.lIIul!,cttla!ll.eM.ant1.e!I.
vfI;, Dl'. WIS.~wr.o......... P.!l.",""",,~Ic>c.I3q1I). ~ ......
"cm»l.. ..... ""'.'et¥~""cvl;lvlm(eot.~I!CZl
synopsys' Predictable Success
66
4/2/2009
Macros (2/3) • Macro usage: ~:'~~'"YdC!i£;;:z:::;:;s:J~~g-:f~~_~__ C>.
~_
;;<,,-__._
~,-:
!,.;<-,~,
=.,
!l'1L*§t)fi@i,;·
Id "5. Vgs (Lg-O.oss urn. Vds..o.OS V)
""'5 .
3. Select curve¢_'o",_o- - - - - - - - .....1aDI.fbrmulleCllrHno'''"' 2e{)5 •
lCOI.oeoofl,asln._.'II""._.Cl>/tcOji.co<,CO
0.5
4. Click "OK"
synopsys' Predictable Success
Macros (3/3) • Macro definition can be edited by Edit>Define Macros ... MacroUst
Name:
1. S~ect "VT" fRnU1
Macro:
ivecvaIX(tangent(<:c l>.veczaro(ditr(
- vecmax(dttf«C';'
~-----2'~croaefinIT~lo~nW-----available (Qrm(..!la commands to create macros are:
jRon :IOSS
acos, acosh, asin . . asinh. atan, atanh# cbrt, ceil, cos, cosh. ert erfc. 6Xp. fabs .. lloor. gamma, jO, j1 ... Igarnma. 109 .. log10. pow, sin. sinh. sqrt. tan. tanh, yO, 1'1. dllC lntegr
'iest1 'testtZ
Add fEd"
Delete
vecmax, vecmln. vecvalX. vecyaly, tangent, veczera Use "
In the macros, where n represerrts: the argument used in the macro (n
must start with 1) .
.close
synopsys' Predictable Success
67
4/2/2009
Threshold Voltage Extraction
synopsys" Predictable Success
Definitions of Threshold Voltage (1/2) Id
Maximum slope of the curve
Definition 2
•
Id VT
t
Definition 1
Vg
--~~------~
VT1
Vg
synoPSYS' Predictable Success
68
4/2/2009
Definitions of Threshold Voltage (2/2) • Macros
VT:
Ivecva7x(tangent«c1>,
veczero(diff«cl> - vecmax(diff«c1»))) , 0.0)
VT1:
I vecva 7x(
1.0e-7)
Script functions
VT:
I f_VT
curveName xmin xmax ymin ymax
VT1:
I f_VT1
curveName xmin xmax ymin ymax
I
>-xmin, xmax, ymin, ymax, the range for computing the result; default values correspond to the full curve range.
synopsys' Predictable Success
Inspect Script (1/4) set N @node@ set Vd 0.05 set Lgshift @Lgshift@ set Lg [expr 2. O"SLgshift+O. 065] fLscalar Lg [format %O.3f SLg] proj_load @plot@ PLT(SN) cv_createDS IdVg(SN) \ "PLT(SN) gaLe OuterVoltage" "PLT(SN) drain TotalCurrent" y cv_setCurveAttr IdVg(SN) "Id" red solid 2 circle 0 defcolor 1 defcolor gr_setAxisAUr X {Gate Voltage (V)} 12 {} {} black 1 10 0 5 0 gr_setAxisAttr Y {Drain Current (A/urn)} 12 {} {} black 1 10 0 5 0 gr_setTitleAtLr "Id vs. Vgs (Lg=SLg urn, Vds=SVd V)" 14 center #- Extraction #- Calculate the threshold voltage [V] set vt [f_VT IdVg(SN)] fLscalar vt [format %O.3f Svt] set vLl [CVT1 IdVg(SN)] fLscalar vt1 [format %O.3f SvLl]
synopsys' Predictable Success
69
4/2/2009
Inspect Script (2/4) Lg Set variables: set set set set
@node@ Vd 0.05 Lgshift @Lgshift@ Lg [expr 2.0*$Lgshift+0.065]
N
H
H
Lgshift
Lgshift
synopsys' Predictable Success
Inspect Script (3/4) Load plot file:
I proj_load @plot@ PLT($N) Create curve: cv_createDS IdVg($N) \ "PLT($N) gate OuterVoltage" "PLT($N) drain TotalCurrent" y
Set curve attribution: cv_setCurveAttr IdVg($N)
"Id" red
solid 2 circle 0 defcolor 1 defcolor
Set axis attributions: gr_setAxisAtLr X {Gate Voltage (V)} 12 {} {} black 1 10 050 gr_setAxisAttr Y {Drain Current (A/um)} 12 {} {} black 1 10 0 5 0
Set title:
Igr_setTitleAtLr
"Id vs. Vgs
(Lg=$Lg um, Vds=$Vd V)" 14 center
synopsys' Predictable Success
70
4/2/2009
Inspect Script (4/4) Calculate VT: Iset
vt
[f_VT
IdVg($N)]
Export the variable to the Family Table of Sentaurus Workbench:
I
fcsca7ar
Calculate VT1 : Iset
vtl
[LVTl IdVg($N))
I
Lg
[format %0.3f $Lg]
... fcsca7ar fcsca7ar
vt [format %0.3f $vt] vtl [format %0.3f $vtl]
synopsys' Predictable Success
Ex 1. Threshold Voltage Calculation Project: IPostBasiclquestionlinspectinmos_rol/off_inspect • Using macros: >Select batch mode Edit Input>Preferences ...
• Using inspect script: >Select interactive mode Edit Input>Preferences ... >Run.
synopsys' Predictable Success
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4/2/2009
synopsys' Predictable Success
Sentaurus Structure Editor ~~~~~~
Generating 20 Boundaries With Online Training Material
synopsys~ Predictable Success
72
4/2/2009
20 Exercise
synopsys' Predictable Success
Steps • Draw> Exact Coordinates • Draw> Overlap Behavior> New Replaces Old
synopsys' Predictable Success
73
4/2/2009
Regions
Region
Material
Coordinates
Substrate Silicon
(-0.5,0), (0.5, 1.0)
Gate oxide
Si02
(-0.2 -40e-4), (0.2 0.0)
Nitride spacer
Si3N4
(-0.2 -0.2), (0.2 -40e-4)
Poly gate
PolySi
(-0.1-0.2), (0.1-40e-4)
Buried oxide
Si02
(-0.5 0.1), (0.5 0.2)
Edit> Separate Lumps.
synopsys' Predictable Success
Rounding Edges
.... Ix
llJrtU-<4 D IAPerture selectl .•
• Edit> Edit 2D > Fillet >'. )
',\/Woe;
...:....;.....~
r:':;-';--'.;..:....-'-':.....;-:...;......;. •• >-'--, : .
c~~.· j~~~t~~3
... ,J:-~::.:- ~~~
r
.
, . "l
'-r:c:lo·~::'-..-.. ~-'--~-"'--.-c~-' .. r~'· :~e>~:_<
1J
~"':~ ....•. :r::-:-.-~---'--'".. -"'.:.-.-.·l: ..~.Jl synopsys' Predictable Success
74
4/2/2009
Declare s
""""
"",
jW)(lOOO 3IJ1;tt.!t411)"
S·
"" I I "'""
I\
0-
I.Jil
• (sdegeo:define--set "source" 4.0 (color:rgb 1.0 0.0 0.0 ) "##") • (sdegeo:define--set "drain" 4.0 (color:rgb 0.0 1.00.0) "##") • (sdegeo:define--set "gate" 4.0 (color:rgb 0.00.0 1.0) "##") • (sdegeo:define--set "substrate" 4.0 (color:rgb 1.0 1.00.0) "##") • (sdegeo:define--set "bodytie" 4.0 (color:rgb 1.0 0.0 1.0 ) "##")
synopsys' Predictable Success
Set (1) • s> Set Edge(s)
• (sdegeo:define-2d- (find-edge-id (position -OA 0.0 0.0)) "source") • (sdegeo:define-2d- (find-edge-id (position OA 0.0 0.0)) "drain") • (sdegeo:define-2d- (find-edge-id (position 0.0 1.0 0.0)) "substrate")
synopsyS' Predictable Success
75
4/2/2009
Add Vertices
• (sdegeo:insert-vertex (position -0.10 0.1 0.0)) • (sdegeo:insert-vertex (position -0.05 0.1 0.0)) • (sdegeo:define-2d- (find-edge-id (position 0.07 0.1 0.0)) nbodytien)
synopsys' Predictable Success
Define Region as • Select Body • s> Set Region Boundary Edges • Edit> Remove> Region
• (sdegeo:set-current--set "gate") • (sdegeo:set--boundary-edges (find-body-id (position 0.0 0.1 0.0))) • (sdegeo:delete-region (find-body-id (position 0.0 -0.1 0.0)))
synopsys' Predictable Success
76
4/2/2009
Renaming Regions • Select Body • Edit> Change Region Name • (sde:add-material (find-body-id (position 0.0 0.8 0.0» "Silicon" "RSubstrate") • (sde:add-material (find-body-id (position 0.0 0.15 0.0» "Si02" "RBox") • (sde:add-material (find-body-id (position 0.0 0.05 0.0» "Silicon" "RSiliconepi") • (sde:add-material (find-body-id (position 0.0 -20e-4 0.0» "Si02" "RGateox") • (sde:add-material (find-body-id (position -0.15 -0.1 0.0» "Si3N4" "RSpacerleft") • (sde:add-material (find-body-id (position 0.15 -0.1 0.0» "Si3N4" "RSpacerright")
• (sde:showattribs "all")
synopsys' Predictable Success
Saving the Model • File> Save Model • (sde:save-model "soifet_bnd n ) • model geometry - native ACIS format file soifet.sat • Ref/Eval windows and parameters - soifet.scm • DF-ISE format refinement and doping - soifet.cmd • DF-ISE format boundary - soifet.bnd
• To use the TOR format for the boundary file: • (sdeio:save-tdr-bnd (get-body-list) "soifet_bnd.tdr")
synopsys' Predictable Success
77
4/2/2009
Defining Constant Doping Levels in Materials • (sdedr:define-constantprofile "ConsLSilicon" "BoronActiveConcentration " 1e+15) • (sdedr:define-constantprofile-material "PlaceCD .Silicon" "ConsLSilicon" "Silicon")
·"remJ!.m·W:\;W!Ijl!)m.:::::r:::::mrr~~.,-~ i
;
~'Pi~cD-5if;;;
""""""""'"
~j
PlillCeTneotType
.J .J
0"'""'"
ORog;on
~l
I..·oon
® Mat"'"
CortrtantProfiltDe1inition------------,
~I
tComt.Sir~·
Name
I
Bor0n.Activ6Concentration
Specb
~J
i
j
j!
~----~lo==~~-----D~~ 0
Decay factor
I
Ch",.. _ _ _
II
Replace
On
I
"'.Ie"-,n!
~
;
------_=-..1
L..-_______
synopsys' Predictable Success
Defining Constant Doping Levels in Regions • (sdedr:define-constantprofile "ConsLEpi" "BoronActiveConcentration" 1e17) • (sdedr:define-constantprofile-region "PlaceCD.Epi" "ConsLEpi" "R.Siliconepi")
rPlaalmentType---------,
o
flef/'Mn
@Atglen
I
I A.SI\Ic:onepl
~l
,CorohlntProllleDefnition------------,
NMn,
·_····--'~I
1<-:0;."_,...:",,,_··_ _ _ _ _ _ _ .
I Spec~
I_""""",eor-"""on
lConct:ntnillon
Jle+17
.¢
I
j
Decay FlIC101'
10
DOn
OR"".,.
: I Cl1~e~t I I'-_""_',..__~"""""_t__.J lb..-.-.-.-.-..---...--------...---.~..-
. - - . - -...--..--..--.... -...--..-.-...-.---~=I
synopsys' Predictable Success
78
4/2/2009
Defining Analytic Doping Profiles (1) Define Baseline (sdedr:define-refinement-window (sdedr:define-refinement-window (sdedr:define-refinement-window (sdedr:define-refinement-window Junctions
Basolino Name
BaseUne.Source
"BaseLine.Source" "Line" (position -0.80.00.0) (position -0.2 0.0 0.0)) "BaseLine.Drain" "Line" (position 0.2 0.0 0.0) (position 0.8 0.0 0.0)) "BaseLine.SourceExt" "Line" (position -0.8 0.0 0.0) (position -0.1 0.0 0.0)) "BaseLine.DrainExt" "Line" 0.1 0.0 0.8 0.0 0.0))
start Point
EndPoint
.(l.80
.(l.20
BaseUne.Orain
020)
0.80)
Qurce extenS10n
BaseUne.SourceExt
.(l.80)
.(l.10)
rain extension
BaseUne.OrainExt
0.10
0.80
Dram
I
Defining Analytic Doping Profiles (2) ~2~----------------' ~1
Junctions
Dram ource ExtenSIon
Dram Extension
Placement Name
Baseline Name
ProfiloName
PlaceAP.Source
BaseUne.Source
Gaussian.SourceOrain
PlaceAP .Drain
BaseUne.Drain
Gaussian.SourceOrain
PlaceAP .$ourceExt BaseUne.SourceExt Gaussian.SourceOrainExt
PlaceAP.DrainExt
BaseUne.OrainExt
Gaussian.SourceDrainExt
01 02 03
)-0.4 05 OS
07
Profile Name
Peak Peak Junction Junction Lateral Concontmtion Position Concontnation Depth Factor
x10,g cm--J
Dum
1017 cm-3
aussian.$ourceQrainEx 5x1016 cm-J
Dum
10 11'cm-J
Gaussian.SourceOrain
0.12um 0.035 m
0.8 0.8
08 09
-05
-025
o
025
05
X
• (sdedr:define-analytical-profile-placement "PlaceAP_Source" "Gauss_SourceDrain" "Baseline. Source" "Positive" "NoRepiace" "Eval") (sdedr:define-gaussian-profile "Gauss.SourceDrain" "PhosphorusActiveConcentration" "PeakPos" 0.0 "PeakVal" 5e19 "ValueAtDepth" 1e17 "Depth" 0.12 "Gauss" "Factor" 0.8) • (sdedr:define-analytical-profile-placement "PlaceAP.Drain" "Gauss.SourceDrain" "BaseLine.Drain" "Positive" "NoReplace" "Eval") • (sdedr:define-analytical-profile-placement "PlaceAP.SourceExt" "Gauss.SourceDrainExt" "BaseLine.SourceExt" "Positive" "No Replace" "EvaI'") (sdedr:define-gaussian-profile "Gauss.SourceDrainExt" "ArsenicActiveConcentration" "PeakPos" 0.0 "PeakVal" 5e18 "ValueAtDepth" 1e17 "Depth" 0.035 "Gauss" "Factor" 0.8) (sdedr:define-analytical-profile-placement "PlaceAP.DrainExt" "Gauss.SourceDrainExt" "Eval") "Baseline. Drain Ext"
synopsys' PredictableSucce$$
79
4/2/2009
Defining Mesh Strategies in Regions • (sdedr:define-refinementsize "RefDef.Epi" 0.1 0.01250.0050.005)
-"""" """"""''''''
(sdedr:define-refinementregion "PlaceRF.Epi" "RefDef.Epi" ''R.Siliconepi'')
IIp,,;,,RF..,,, .
~I
o Aef/Wln
1
~I
®RogIOn
IR.-"""
~I
lf~ ~
!
~
I
i
~l 1
0""1"'"
Reflf'lementDef.rutlon-.-----------
(sdedr:define-refinementfunction "RefDef.Epi" "Doping Concentration" "MaxTransDiff' 1)
yOirectlon
X Directlon
ZOlrcctlon
Max Element Size
10.100000
~_012500
Min EJementSlze
rjooo-,-ooo--
r~0--050--00~-
Change P1ac:ement
II
r----
I
Dele:te PIacemerlt
Defining Mesh Strategies in Refinement Windows • (sdedr:define-refinementwindow "RefWin.all" "Rectangle" (position -0.5 1.0 0.0) (position 0.5 -0.2 0.0» • (sdedr:define-refinementwindow "RefWin.Channel" "Rectangle" (position -0.1 0.00.0) (position 0.1 0.1 0.0» (sdedr:define-refinementsize "RefDef.all" 0.25 0.1 0.250.1) • (sdedr:define-refinementplacement "PlaceRF .all" "RefDef.all" "RefWin.all")
~I
Placement Name
~
I~""""'="':='=======::: I ·1 j ~I YOirectlon MaX Bement SIze
10250000
Min 8ementS@
r-lo,-ooooo---lo.looooo
Z Direction
,Refrnemenifu'lctiOr'l:l---------------,
i 180"'Wtiv
II I
a.n,,_,
II
""'I,,,,,,,,",,,,,
"'.;IA.I•• I•• · •.• ,
80
4/2/2009
Defining a Multibox Mesh Strategy in Refinement Windows • (sdedr:definemultibox-size "MB.Channel"
0.050.01250.025 1e-41 1.35)
Llfptace_M_B.O=m __ ' _ _ _ _ _--'~l
Placement Name p",,""""TYP'
!
r
RefI'Mn
I
,-, "-""o-.o,-ann-d----:-.~
! rM"tiboxDFefl""~""~~__~~_~
i -,I,-!MB~~~_ _ _ _ _ _~~I • (sdedr:definej v multibox01 0 1. = placement 1 """ 1°·050000 M;n 10.000100 10.025000 "PlaceMB.Chann 1 "'" "'" R>.tlo )1.000000 11.350000[ el" "MB.Channel" I "RefWin.Channel" ;~----------------~ ) I I =.,p,=",. I I "'."P""""'" I I 00" L .......................--........-----.--.-...-............-...-..-. ".J
-
-
X
Ratio
Ratio
II
synopsys' Predictable Success
Build Mesh • Mesh> Build Mesh. o
001
>0.5
002 0>-
003
004
005
·0.5
-0.25
0
0.25
0.5
X
synopsys' Predictable Success
81
4/2/2009
Sentaurus Structure Editor 3D Structure With Online Training Material ~--~~======--~
synopsys" Predictable Success
2D 501 M05FET • Draw> Auto Region Naming [off] • Exact Coordinates • Draw> Overlap Behavior> New Replaces Old • Isometric View • Draw> Create 3D Region> Cuboid • (sdegeo:create-cuboid (position -0.25 -0.2 0) (position 0.25 0.2 -1.0) "Silicon" "SubsSilicon") •
(sdegeo:create-cuboid (position -0.2 -0.2 0) (position 0.2 -0.1 -0.2) "Oxide"
"TrenchOxide_Right") • {sdegeo:create-cuboid (position -0.2 0.1 0) (position 0.2 0.2 -0.2) "Oxide" ''TrenchOxide_Left") • (sdegeo:create-cuboid (position -0.15 -0.2 0) (position 0.15 0.2 0.002) "Oxide" "GateOxide") • (sdegeo:create-cuboid (position -0.1 -0.1 0.002) (position 0.1 0.2 0.1) "PolyS;" "PolyGate")
synopsys' Predictable Success
82
4/2/2009
Changing View
synopsys' Predictable Success
Poly Re-oxidation • Old Replaces New
f1)JJ!iilJi;ij]@~ tOld replaces
nOWl
• (sdegeo:set-default-boolean "BAB") • (sdegeo:create-cuboid (position -0.103 -0.1030) (position 0.103 0.2 0.1) "Oxide" "PolyReOxide1 If) • (sdegeo:create-cuboid (position -0.15 -0.103 0) (position 0.15 0.2 0.005) "Oxide" "PolyReOxide2")
synopsys' Predictable Success
83
4/2/2009
Nitride Spacer • (sdegeo:create-cuboid (position -0.15 -0.15 0) (position 0.15 0.2 0.08) "Si3N4" "NiSpacer") • (sde:define-parameter "fillet-radius" 0.03 0.0 0.0 ) • (sdegeo:fillet-edges (list (car (find-vertex-id (position -0.15 -0.15 0.08))) (car (find-vertex-id (position 0.15 -0.150.08))) ) filletradius)
synopsys' Predictable Success
Define s
I
~
It
(sdegeo:define--set "gate" 4.0 (color:rgb 1.00.00.0) "##" ) (sdegeo:define--set "drain" 4.0 (color:rgb 1.00.00.0 ) "II"
)
(sdegeo:define--set "source" 4.0 (color:rgb 1.00.00.0) "==" ) (sdegeo:define--set "substrate" 4.0 (color:rgb 1.00.00.0 ) "<><>" )
synopsys' Predictable Success
84
4/2/2009
Setting s at Existing Faces i
none gate drain source
I§J~:< 0'0 , IAPerture Selec(
• s> Set Face(s) • (sdegeo:set-current--set "substrate") • (sdegeo:set--faces (find-face-id (position 00 -1)) "substrate") • (sdegeo:set-current--set "gate") • (sdegeo:set--faces (find-face-id (position 0 0 0.1)) "gate")
synopsys' Predictable Success
Setting s at New Faces The corresponding Scheme commands for creating and deleting the two metal regions are: (sdegeo:create-cuboid (position 0.17 -0.1 0) (position 0.25 0.1 0.05) "Metal" "Source") • (sdegeo:create-cuboid (position -0.25 -0.1 0) (position -0.17 0.1 0.05) "Metal" "Drain") • (sdegeo:delete-region (find-body-id (position 0.22 0 0.025))) • (sdegeo:delete-region (find-body-id (position -0.22 0 0.025)))
The corresponding Scheme commands for placing the source and drain s are: (sdegeo:set-current--set "source") • (sdegeo:set--faces (find-face-id (position -0.22 0 0)) "source") • (sdegeo:set-current--set "drain") (sdegeo:set--faces (find-face-id (position 0.220 0)) "drain")
synopsys" Predictable Success
85
4/2/2009
Defining Constant Doping Levels in a Region • (sdedr:define-constant-profile "Const.Bulk" "BoronActiveConcentration" 1e17) • (sdedr:define-constant-profile-region "PlaceCD.Bulk" "Const.Bulk" "SubsSilicon") • (sdedr:define-constant-profile "Const.Poly" "ArsenicActiveConcentration" 1e20)
I~
I~-
;1
1,-"
• (sdedr: define-constant-profile-region "PlaceCD. Poly" "Const. Poly" "PolyGate")
synopsys' Predictable SUC~$$
Defining Analytic Doping Profiles • Mesh> Define Ref/Eval Window> Rectangle. • (sdedr:define-refinement-window "Baseline. Source" "Rectangle" (position 0.30 -0.25 0.0) (position 0.15 0.25 0.0) ) • (sdedr:define-refinement-window "BaseLine.Drain" "Rectangle" (position -0.30 -0.25 0.0) (position -0.15 0.25 0.0) )
• Device> Analytic Profile Placement • (sdedr:define-gaussian-profile "Gauss.SourceDrain" "ArsenicActiveConcentration" "PeakPos" 0.0 "PeakVal" 1e19 "ValueAtDepth" 1e17 "Depth" 0.1 "Gauss" "Factor" 0.8) • (sdedr:define-analytical-profile-placement "PlaceAP.Source" "Gauss.SourceDrain" "Baseline. Source" "Both" "NoReplace" "Eva I") • (sdedr:define-analytical-profile-placement "PlaceAP.Drain" "Gauss. SourceD rain" "Baseline. Drain" "Both" "NoReplace" "Eval")
synopsys' Predictable Success
86
4/2/2009
Defining a Meshing Strategy in a Window • (sdedr:define-refinement-window "RefWin.Global" "Cuboid" (position -0.250.2 -0.5) (position 0.25 0.2 0.1)) • (sdedr:define-refinement-size "RefDef.Global" 0.1 0.1 0.1 0.05 0.05 0.05 ) • (sdedr:define-refinement-placement "Place. Global" "RefDef.Globaln "RefWin.Global" ) • (sdedr:define-refinement-window "RefWin.Active" "Cuboid" (position -0.25 0.2 -0.15) (position 0.25 0.2 0.0)) • (sdedr:define-refinement-size "RefDef.Activen 0.025 0.025 0.025 0.0125 0.01250.0125 ) • (sdedr:define-refinement-placement "Place.Active" "RefDef.Active" "RefWin.Active")
fff?/ff"WFr~rwepw11rtto.~~
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i ....
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1--~~~; r:==::--·--;IIv.:·:----··. ··:·l-;. ---··-..----··. .·ll. 1
Il[______. ~~:___I=_________->~~J I!
i~~==~====~----~~~ 11--11 1 .. ________ ~; I :J
synopsys' Predictable Success
Defining a Multibox Mesh Strategy in a Refinement Window • (sdedr:define-refinementwindow "RefWin.Channel" "Cuboid" (position -0.12 -0.1 0.05) (position 0.12 0.1 0»
t!"ml:>tlrla:Ollrn.1
;1
• (sdedr:define-multibox-size "RefDefMB.Channel" 0.1 0.1 0.01 0.050.050.001 1 1 -1.5 ) • (sdedr:define-multiboxplacement "PlaceMB.Channel" "RefDefMB. Channel" "RefWin. Channel" )
synopsysPredictable Success
87
4/2/2009
Build Mesh
The corresponding Scheme command is: • (sde:build-mesh "mesh" "-P" "3dmos") In the TOR format, the Scheme command for the meshing operation is: • (sde:build-mesh "mesh" "-P -F tdr" "soifet_msh") Note: use SNMESH (doping profile [tdr] can be viewed with option in postprocess)
synopsys' Predictable Success
synopsys' Predictable Success
88
4/2/2009
Sprocess simulation by Ligament • Sprocess > properties: select "Use Ligament" option on the dialog box • Edit Input> Ligament flow: set up a process flow • Ligament Workspace: refer to on-line training material "Ligament 0.7 Ligament Workspace" • On-line training material provide a detail introduction in chapter "Ligament"
synopsys' Predictable-Success
Ligament • Use Ligament to Build up the Device Structure
........... bO~On
synopsys' Predictable Success
89
4/2/2009
Environment & Substrate Names
Name
S'-:;::::i'Flow"-
i-:R~
t--~ substrate 9--!i£" well
~"")trtle'
title dop~
: boron
concen
f-{-) grid i-(-) debug
H-) chec.~'.d
43-:!~ Gox e-!~ Po!yGate
e-!Ei"
LOO
e.-:.!~ S.pacer l3-!~ SO e-=!~ Metal r!1t- struc 9-!~
: Boolean . Soolean
true false
:-~:~~:r .~~: string
}-(-)
Boolean :"Dlstarlce
: Sjde
; GrId
d~pant
boron
concen
r3Jse 5
"um Ad:-'3!.lCed~al!br:·
Y-:-) tsupre~_min_hOrI.z~ Dj~tance_.
0.1
Name
"e
"0011 'n@oode@ \@node@ front
'O.S 0.1
0.5
Concentration
i..-.{-) resistivity 1-{-) orientation
Y-ltype
boron
1e15
Resistivity
o
Number
100
Type
:um
Value
Type
"O'opa"t
'~:'j"dopa~t''-(-) concentration
# 2D nMOSFET save
false false sprocess
8--(-) gnd_refinement _ :'~ridff~! ~-:-(-) ~~pr~~..~~I~,..velf:. Q~aJ}~~_ tsuprem4_delta_ho~ Distance r--(-) tsuprem4_mln_vertl~ Distance
r--<-)
Un"
20 -n~iOSFET
we
~~=~ :~:~~ q;~~~~ j--(-) node ..
1--<-) -9r1 d
iii
Boolean
Boolean
H-) sIde g~p'hjcs . r-:--<-) depth
extraccsa. . _e .
Value
:... __ ~y~e
·········S·tnn·g·_·_·-
l-:-::-(-:l s.ave
:.4! ~.9. nM.OSFET ~a~
/emJ ohm-em
defautt
synopsys' Predictable Success
Well Implant, Gate Oxide, PolyGate A .. 20 nMOSFET
material
conce
·OXide····
thicknes
sp~cies
""biiro"Tl
species
boron boron
time
O.~_~ec _
:-sp~"a~s
~atefjai'v
save.
boron
oxide
doss······ dose dose
"t~~p.~ra
thicknes
.- Gate te~per
10 min ··S mln~-
tempe
t~'mp~~
~.P.~~.~s
'iext
'dia-s'
pOlyGat~ poly.
...~P'!p'g.~.~
mate~ii1 material
poly
'matertaJ
oxide
thicknes
10 min
1~~P~~
resist
thicknes
ttircknes
synopsys' Predictable Success
90
4/2/2009
LDD, Nitride Spacer, Source/Drain, Metal Pad Names 8--~Flow
. ,...._.~9_.. _.._. ..-.. -~~~!~. -~ ..;
f..-·B environment ;-~4,l
substrate
title
dopa f'!1
AI
., 20 nMOSFET save boron concent
13---!~ well
13-'}; Gox
e-·!.F Po!yGate S,..!~
LDD
1 ~~. ~omment
sp~-;:Ies.
boron
dose
species
tioron
. dose
specie:s.
boron ~or'~n
. ~C?s~
,
J--
l--~jnsert
r-~~ Implant
~~.tmp!?O~
L-Jl~ anneal ~··:-T-!.~ Spacer
I. ~comm~nt deposit
I, 1
... LDD
dlDS
r-~imp!~t r--~ implant ~ implant
1
I
text
:-----;}> Insert
etch
l--"T
~e1Ch
$p~.cle_~ sp~c!.es
text material
"dose
spraees
dlos
,time
spracss
arsenic 0.02 sec
dose te_mp:9:~
. ~pacer
material
nitride nitride
matedai
oxide
text
SD
thlCknes thlcknes thicknes
&.T!~ SO
1 -}--c;D comment 1 }-~insert
I
}--~
!mplant
L_,..6"", anneal
~~~h
~~depOSjt
f-/;5 rnsert : r--i!, etch
! l~~etch
8--!a- struc
9--!~
diDS
sproees
arsenic 0.02 sec
tempera:
material
oxide aluminum
: 1hlcknes thicknes
dlos matenal material
aluminum resist
thlcknes thicknes
species time material
dose
sproc.es
synopsys' Pred lctable SUccess
extract_save
Environment • Title:
20 nMOSFET 0.18
• Simulator: sprocess • Region:
0011
Substrate • Dopant: boron • Concentration: 1e15 Icm3 synopsys' Predictable Success
91
4/2/2009
Well • Deposit:
oxide, 0.01 um
• Implant: • Boron, does 2e13/cm2, energy 200 keV • Boron, dose 1e13/cm2, energy 80 keV • Boron, dose 6e12/cm2, energy 25 keV
• Anneal: 0.3 sec, 1050 C, 1 atm, Nitrogen 100% • Etch: oxide, strip
synopsys' Predictable Success
Gate Oxide • Anneal: 5 min, 650-850 C, 1 atm, Nitrogen 100% • Anneal: 10 min, 860 C, 1 atm, Oxygen 100% • Anneal: 5 min, 850-650 C, 1atm, Nitrogen 100% • Grid Remesh (Insert) • grid remesh • select z=Boron • layers
synopsys' Predictable Success
92
4/2/2009
Poly Gate • Deposit: poly, 0.18 urn • Mask (insert): • mask name=gate_mask left=-0.1 right=\$lgate/2 negative • photo mask=gate_mask thickness=2
• Etch: poly, 0.2 urn, anisotropic • Etch: resist, strip • Etch: oxide, 0.1 urn, anisotropic • Anneal: 10 min, 900 C, 1 atm, nitrogen 5 IImin, oxygen 5 IImin
synopsys" Predictable Success
LDD • Remesh (insert) • refinebox silicon min= {O.O O.S*\$lgate-O.OS} max= {0.06 0.S*\$lgate+0.04} xrefine= {O.01 0.01 O.01} yrefine= {O.01 0.003 O.01} add • refinebox remesh • transform reflect left
• Implant: • boron, Dose=\$HaloDose/4 rotation=O • boron, Dose=\$HaloDose/4 rotation=90 • boron, Dose=\$HaloDose/4 rotation=180 • boron, Dose=\$HaloDose/4 rotation=270
cm2, energy= \$HaloEnergy keV, tilt=30, cm2, energy= \$HaloEnergy keV, tilt=30, cm2, energy= \$HaloEnergy keV, tilt=30, cm2, energy= \$HaloEnergy keV, tilt=30,
• Cut (insert): transform cut location=O.O left • Implant: arsenic, 1e15 cm2, 20 keV • Anneal: 0.02 s, 1050 C, 1 atm, nitrogen 100%
synopsys' Predictable Success
93
4/2/2009
Spacer • Deposit: nitride, 60 nm • Etch: nitride, 84 nm, anisotropic • Etch: oxide, 10 nm, anisotropic
synopsys' Predictable Success
Source/Drain • Mesh refine (insert) • refinebox silicon min= {O.O \$lgate/2-0.02} max= {0.22 \$lgate/2+0, 15} yrefine= {0.02 0.01 0.02} add • refinebox remesh
• Implant: arsenic, 4e15 Icm2, 30 keV • Anneal: 0.02 s, 1080 C, 1 atm, nitrogen 100%
synopsys" Predictable Success
94
4/2/2009
Metal • Etch: oxide, 5 nm, anisotropic • Deposit: aluminium, 30 nm • Mask: • mask name=s_mask segments = {-O.1 \$lgate/2-0.005 \$lgate/2+0.1 \$ymax} negative • photo mask=s_mask thickness=2
• Etch: aluminum, 0.25 um, anisotropic • Etch: resist, strip
synopsys' Predictable Success
Finalise (insert) • • • • • • • • • • • • • • • • • • •
transform clip min= {-1 -1} max= {2 10} name=gate point x=-O.2 y=O.001 replace name=drain point x~0.02 y=\[expr \$ymax - 0.001\] replace name=substrate box silicon xlo=1.5 ylo=O xhi=2.5 yhi=\$ymax set Ygox \~nterface oxide /silicon y = 0.001 \] set Ypol \~nterface poly /oxide y = 0.001 \] setYtmp \[expr\$Ygox + 0.005\] setTox \[expr\$Ygox - \$Ypol\] sel z = NetActive set Xgd \[interpolate x = \$Ytmp silicon val=1 e15\] set Xj \[interpolate y = 0.5"\$lgate+0.39 silicon val=1e15\] #set Lgeff x puts \"DOE: Lgeff\[format %.3e \[expr 2.0*\$Xgd\]\]\" #setXj x puts \"DOE: Xj \[format %.3e \$Xj\]\" #setYgox x puts \"DOE: Ygox \[format %.3e \$Ygox\]\" #setTox x puts \"DOE: Tox \[format %.3e \$Tox\]\"
synopsys' Predictable Success
95
4/2/2009
synopsy~r Predictable Success
cvQVrfWrve: long channel transistor Bottom region: Good fit indicates. that the channel profile is correct Accumulation region:
2e-14~--------~--------~~Jr--lL
Inversion region: Used to adjust the doping concentration in poly-SiJicon.
______________J
Good fit indicates correct oxide thickness. ~
Threshold voltage:
~ le-14
yDopant concentration at the gate oxide interface )- Interface charges
-2
-1
synopsys' Predictable Success
96
4/2/2009
C-V Device Simulation • Small-signal AC analysis (2007.12 P.183) • AC simulation are performed in mixed mode (2007.12 P.163).
• Extract conductance and capacitance of each node, and output matrix A (conductance) and matrix C (capacitance). • j = Yu = Au + iwCu • j is the vector containing the small-signal currents at all nodes.
• u is the corresponding voltage vector.
synopsys' Predictable Success
C-V Simulation Command File Device "device1"
{
File { "define device input and output file"} Electrode { "same with IV simulation"} Physics { "same with IV simulation and tum on minority carrier quantum potential equation for accumulation side CV extraction" }
} File
{ "define system output file"}
Plot
{ "same with IV simulation"}
Math
{ "same with IV simulation" }
System { "based on previous device1 and the voltage source of each node construct a simple circuif' }
Solve
{ "set bias sweeps sequence, solve transport models and extract AC parameters" }
synopsys' Predlctable$uccess
97
4/2/2009
c-v Device Simulation
Result
• Cgg: gate node capacitor • Ccg: drain node + source node
1e-15
• Cbg: substrate node Cgg = Ccg + Cbg
1e-013 -1
"
Gate Voltage (V)
-~
~ 5e-014
v
o
-1
synopsys' Predictable Success
Convergence - Breakdown Device Simulation • n-th step converge, next l1V n+1 > l1V n • n+1-th step diverge, then l1V n+1 = l1V n/2 • The voltage step will be divided by 2 again and again, until it converges or until it reaches a minimum step that we define in the command file.
10
,_-----VL: ,
synopsys' Predictable Success
98
4/2/2009
Breakdown Device Simulation • An approach to solve divergent and snapback issues • Introduction please refer to on-line training material "SDevice section 0.1 MOSFET Breakdown Simulation" ~...10S
Breakdown
Vd_outer (force)
rl l- - - - , Drain Voltage (V)
synopsys' Predictable Success
Breakdown Device Simulation • Modify SDevice command file • Turn on Avalanche and Band2Band model • Solve dual carrier transport • Detail please refer to 90nm nMOS breakdown example.
synopsys' Predictable Success
99
4/2/2009
synopsys' Predictable Success
Preparation • Copy the 0.18um_nMOS project and rename it as 90nm_nMOS, then clear up all the output files • SProcess uses the -f option to speed up the simulation time for structure verification • -f option skip diffusion and monte carlo implant step • Refer to SProcess manual 2007.12 P .52 • It will cause some parameter extraction failure because of a missing net doping profile. When we are sure the device structure is correct, we should remove the -f option to do a complete simulation.
synopsys' PrecfictableSucce$s
100
4/2/2009
Reference: SProcess, pS2 • Command-line options Option
--Fa"n!ode
Shottnam~
Function
-b
Switcb off graphics.
-f
Gt."llC'~tI.c stJ:ucturc~
00 ditru};ton.. n(l rncimpiUlll. and so
Oil. --GENES.IS€..~;:
-11
SwItch off Jot.:
fil~
--pdb
-p
Run F"J.t"::U11Ct.:.(
Dat.tt'ta;;~
th~y ,:tfc s>.!'t
creation.
Browser 'Showing par:l.mct€'ls 3.~
duriUf: nll1-tim~
11lA.~ludtt
dcia.ult pafatnt.!'tr.:t"'3
and pafamc("'" ffOOl the input 111< if ~p~ifi.ed.
synopsys' Predictable Success
Structure Comparison • 0.18um nMOS
• 90nm nMOS
synopsys' Predictable Success
101
4/2/2009
Process Comparison • 0.18um nMOS
• 90nm nMOS
WeliNth implant & anneal
WeliNth implant & anneal
Boron dose=2e13 energy=200 till=O rol=O Boron dose=l e13 energy=80 till=O rol=O Boron dose=6e12 energy=25 till=O rol=O diffuse temp=1050 time=0.3<s>
Boron dose=2e13 energy=200 till=O rot=O Boron dose=le13 energy=80 till=O rot=o Boron dose=8e12 energy=30 till=O rol=O diffuse temp=l 050 time=0.3<s>
Gox-33A
Gox-18A
diffuse temp=650 ramprate=0.6666 time=5 diffuse temp=850 time=10 02 1atm diffuse temp=850 ramprate=-O.6666 time=5
diffuse temp=650 ramprate=0.6666 time=5 diffuse temp=850 time=l 0 02=0.8
POLY height = O.18um
POLY height = O.15um
deposit poly type=isotropic thickness=0.18
deposit poly type=isotropic thickness=0.15
Halo/LDD implant & anneal
Halo/LDD implant & anneal
Boron dose=le13 energy=15 till=30 I roI=0,90,180,270 Arsenic dose=le15 energy=20 tilt=O rol=O diffuse temp=l 050 time=0.02<s>
Boron dose=2e13 energy=12 tilt=30 I rot=d,90,180,270 Arsenic dose=l e15 energy=5 tilt=O rot=o diffuse temp=l 020 time=0.03<s>
synopsy:r Predictable Success
Process Comparison • 0.18um nMOS
• 90nm nMOS
Nitride Spacer
ONO Spacer
deposit nitride type=isotropic thickness=0.06 etch nitride type=anisotropic thickness=O.084 etch oxide type=anisotropic thickness=O.Ol
deposit oxide type=isotropic thickness=0.005 deposit nitride type=isotropic thickness=0.015 deposit oxide type=isotropic thickness=0.06 diffuse temperature=720 time=20 etch oxide type=anisotropic thickness=0.1 etch nitride type=anisotropic thickness=0.03 etch oxide type=anisotropic thickness=0.015 #- consider native oxide - - - - - - deposit oxide type=isotropic thickness=0.0015
Source/Drain implant & anneal
Source/Drain implant & anneal
implant Arsenic dose=4e15 energy=30 till=O rot=O implant Phosphorus dose=1e15 energy=6 till=O rol=O implant Arsenic dose=5e15 energy=30 tilt=O rol=O diffuse temp=1080 time=0.02<s> diffuse temp=l 050 time=0.03<s>
synopsys' Predictable Success
102
4/2/2009
SProcess Mesh Comparison • 0.18um nMOS
• 90nm nMOS
==--------~~-
---------~
SDevice Mesh Comparison • 0.18um nMOS
_'--1
• 90nm nMOS
=-=-=c;;-----,,------:
103
4/2/2009
Id_Vg Curve Comparison • 90nm nMOS
• 0.18um nMOS
• Vdd=1.2v; Vds=O.05v
• Vdd=1.5v; Vds=O.05v O.18um 0.0001
8e-05
VS.
90nm nMOS IdVg Vds=O.05 0.0002
.---gm_0.18um ·---gm_90nrn -ld_0.18um -ld_90nm ;
0.00015 (!l
E
3
6~05
~
::!:!
00001 4~
~ <'
~ c·
3
~
5~05
2e-05
0 +-~~~~~~r-r-~~~~~-+O 0 1.5 0.5
synopsys'
Vg (volt)
PredlctableSuccess
Hints • Need to translate the process conditions into correct syntax of Sprocess. • Poly height has been changed from O.18um to O.15um, need to update the coordinate of gate in Sprocess. • After finish the modification of Sprocess, whole simulation flow (Sprocess, SSE, Sdevcie, Inspect) can be executed well. • In Sprocess, fine tune LOO & SO refine-box to get a more accurate doping profile. • In SSE, fine tune variable "PNres" to optimize the mesh of LOO and SO junction to get a more accurate Sdevice simulation result.
synopsys' Predictable Success
104
4/2/2009
Modify nMOS Template to pMOS • SProcess: change to pMOS process condition • SDE: change PLOY dopant type from N-type to P-type • SDevice • Change majority carrier from electron to hole and related models. (Exchange e and h in input file in most cases.)\ • Biasing Condition
• Inspect: change device type and extraction region for "Extraction library"
synopsys' Predictable Success
Structure Comparison • 90nm nPOS
• 90nm nMOS 1.....
synopsys' Predictable Success
105
4/2/2009
synopsys" Predictable Success
Process Comparison • 90nm pMOS
• 90nm nMOS
WeliNth implant & anneal
WeliNth implant & anneal
Phosphorus dose=2e13 energy=3S0 tilt=O rot=O Phosphorus dose=1 e13 energy=200 tilt=O rot=O Arsenic dose=4e12 energy=100 tilt=O rot=o diffuse temp=1 OSO time=0.3<s>
Boron dose=2e13 energy=200 tilt=O rot=O Boron dose=1 e13 energy=80 tilt=O rot=o Boron dose=8e12 energy=30 tilt=O rot=O diffuse temp=1 OSO time=0.3<s>
Halo/LDD implant & anneal
Halo/LDD implant & anneal
Arsenic dose=2e13 energy=80 tilt=30 I rot=O,90,180,270 BF2 dose=6e14 energy=3 tilt=O rot=o diffuse temp=1 020 time=0.03<s>
Boron dose=2e13 energy=12 tilt=30 I rot=O,90,180,270 Arsenicdose=1e15 energy=5 tilt=O rot=O diffuse temp=1020 time=0.03<s>
Source/Drain implant & anneal
Source/Drain implant & anneal
implant Boron dose=1e1S energy=3 tilt=O rot=O implant Boron dose=Se13 energy=6 tilt=O rot=O diffuse temperature=10S0
implant Phosphorus dose=1e15 energy=6 tilt=O rot=O implant Arsenic dose=5e15 energy=30 tilt=O rot=O diffuse temp=1050 time=0.03<s>
Structure Extraction
Source/Drain implant & anneal
set Xgd Dnterpolate x = $Ytmp silicon val=-1e15] set Xgd Dnterpolate x = $Ytmp silicon val=1e15] set Xj [interpolate y = 0.5*$lgate+0.39 silicon val=-1e15] setXj Dnterpolate y = 0.5*$lgate+0.39 silicon val=1e15]
synopsys' Predict3bleSuccess
106
4/2/2009
Other Parameters • 90nm pMOS
• 90nm nMOS
Poly Doping
Poly Doping
(sdedr:define-constant-profile "Const.Gate" "BoronActiveConcentration" PolyDop )
(sdedr:define-constant-profile "Const.Gate" "BoronActiveConcentration" PolyDop )
Biasing
Biasing
Goal { Name="drain" Voltage=-@Vds@ } Goal { Name="gate" Voltage=-@Vdd@ }
Goal { Name="drain" Voltage=@Vds@ } Goal { Name="gate" Voltage=@Vdd@ }
Coupling
Coupling
Coupled { Poisson Hole hQuantumPotential }
Coupled { Poisson Electron eQuantumPotential }
Inspect
Inspect
setType pMOS set SS [ExtractSS
SS
set Type nMOS IdVg($N) [expr $Vti+O.0511 set SS [ExtractSS
SS
IdVg($N) [expr $Vti-O.0511
synopsys' Predictable Success
synopsys' Predictable Success
107
4/2/2009
Outline • How to a SolvNet ? • What kind of TCAD resources we can find on SolvNet? • Software, • Manual • Release Notes • TCAD Example updates
synopsys' Predictable Success
SolvNet Website
http://solvnet.synopsys.com/
synopsys' Wek:o.me To Syn0:p-sysSlg" In
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)u<>-••.,~oo"",1·"-'¥'"'4
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synopsys' Predictable Success
108
4/2/2009
SolvNet
synopsys'
New Registration
synopsys' Predictable Success
SolvNet O::.rl;-
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synopsys' Predictable Success
109
4/2/2009
SolvNet -----------'3 cJ
Isynopsys
Go
50;,,["2,
r'jj/':T !-,i§iitr-tttm1ilti!MtHHS_ _4#iiMillli@
[email protected] i
New Use,. Registration
i
Important: Please Read Before ing To. access to all Synopsys Online Services. ,;ou must provlde an serdees include ~
k~r"·,,,
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In
the field below These
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~
OnGne Product DocumentatlOn • SmartKe\, license Retrie-.C31
.,. Electronic Software DO'A
Add Another Site
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synopsys' Predictable Success
SolvNet syn0psys,
50ivN",
New Registration
Thilnk you ror submitting your SolvUet registration. Your registration is not yet complete. Since you are requesting access to confidential Synopsys infurmati::m, ",e wll1 need to 'ie-rifj your site infotrro3tion_ You will recerve an email asking you to confirm your email address. Please be sure to read and
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synopsys' Predictable Success
110
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SolvNet HomePage
search TCAD documents by keyword
> VI."!"" ST AR<;
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ViHATS Nfj."'1 ON SOLVNH {'<';"-">~~~"S'I'~
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Th~ Soh-Net Do'hnlo.ad Center f<:!atur,:-s a redeslqned int~".! that dispLays the lat~st ,jownl.r:.ad information for "our S..nopsvs
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mcduJes tv IEam about r~le3s-e .:nh3~m.:nts to DFT, Star RCXT, T'2trar-laY", SSD Compiier, DesliJf1 CQmpd",r, Ie Compder. NanoTime, Pnm~Tlm-=, Pru.neTlflle ~·X, and ~!J.,.,~r Compd':"!f.
synopsys' Predictable Success
Predictable Success
synopsys' Predictable Success
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Untitled We will be conducting a TCAD Sentaurus product tralnlng in our office on the 8th and 9th of April in our synopsys singapore training center: 300 Beach Road, #31-06, The concourse, singapore 199555. The agenda are as follows: Title: Sentaurus TCAD Training for CMOS Application Day 1:
Day 2:
Sentaurus TCAD Overview Sentaurus workbench Sentaurus Process 1D & 2D Telot SV Sentaurus Structure Editor - Building Meshes Sentaurus Device I-V simulation Inspect 90nm nMOSFET Exercise c-v Device Simulation Breakdown Device Simulation pMOSFET Device Simulation Ligament Introduction SolvNet Resources
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